Failure Rate Mathematical Models for Discrete Semiconductors.
Final technical rept. Jul 76-Nov 77,
MARTIN MARIETTA AEROSPACE ORLANDO FLA
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This study revises and updates the appropriate sections of Military Handbook 217B, Reliability Prediction of Electronic Equipment, pertaining to semi-conductor devices, section 2.2. More than 200 billion part-hours of field operating data were collected and analyzed during the study effort. Significant revisions were made to environmental factors and some quality factors. Author
- Electrical and Electronic Equipment
- Manufacturing and Industrial Engineering and Control of Production Systems