Accession Number:

ADA048245

Title:

Microcircuit Device Reliability Memory/LSI Data, Winter 77-78,

Descriptive Note:

Corporate Author:

ITT RESEARCH INST CHICAGO IL RELIABILITY ANALYSIS CENTER

Personal Author(s):

Report Date:

1977-11-01

Pagination or Media Count:

273.0

Abstract:

This compendia of Microcircuit Reliability data is divided into several sections. One section summarizes memory and LSILarge Scale Integration test and field data. These analyses include the summarization of screening and environmental test results, life test data, reliability demonstration data, failure summaries and the comparison of observed and MIL- HDBK-217B predicted failure rates. In another section, screening, environmental, life, reliability demonstration tests and field experience data are presented for memory and LSI devices in detail. The detailed data is presented in sections according to device function and further ordered by device technology and complexity.

Subject Categories:

  • Electrical and Electronic Equipment
  • Manufacturing and Industrial Engineering and Control of Production Systems

Distribution Statement:

APPROVED FOR PUBLIC RELEASE