Reliability Evaluation of Programmable Read-only Memories (PROMs) Part II.
Final technical rept.,
HUGHES AIRCRAFT CO CULVER CITY CA STRATEGIC SYSTEMS DIV
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The primary objectives of this study were to 1 assess factors affecting the reliability of three types of Programmable Read-Only Memories PROMs, namely Polysilicon Fuse, Avalanche-Induced-Migration AIM and Nichrome Fuse Technologies, 2 Investigate fusing and associated failure mechanisms and 3 Assess the reliability of these PROMs via a life test.
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