A Reflectometer Facility for the Measurement of Transmission and Reflection of Light at Normal Incidence.
WEAPONS RESEARCH ESTABLISHMENT SALISBURY (AUSTRALIA)
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A reflectometer facility has been developed to measure the normal incidence transmission and reflection of light from flat surfaces. The reflectometer is used to aid the study of the optical properties of thin film systems and some measurements are used to calculate the optical constants of substrates and thin films. The reflectometer facility and the procedure for alignment of the reflectometer is described. Author