Low-Frequency Noise in (HG, CD) TE Detectors.
Final rept. 1 Apr 74-30 Jun 76,
MINNESOTA UNIV MINNEAPOLIS DEPT OF ELECTRICAL ENGINEERING
Pagination or Media Count:
The purpose of this study was to identify and understand the sources of 1f noise in n-type HgCd Te detectors and to recommend methods for reducing this noise. Four items were investigated a Noise generated at noisy contacts. This could be interpreted as injection 1f noise. b Noise at grain boundaries. We found devices with grain boundaries to be noisier than those without it in our geometry the difference was a factor 4. c Noise generated at the surface versus bulk noise. We found the noise to be more variable from sample to sample than bulk noise permits. We also showed by a direct experiment MIS devices that the flicker noise was surface generated. d A modulation technique was developed for discriminating between noise sources, but was not used in the experiments under c. Author
- Infrared Detection and Detectors
- Solid State Physics