Accession Number:

ADA036561

Title:

Development of X-Ray Diagnostics for Advanced Concepts Simulation Facilities.

Descriptive Note:

Final rept. May 73-Aug 74,

Corporate Author:

SCIENCE APPLICATIONS INC SUNNYVALE CALIF

Personal Author(s):

Report Date:

1976-09-08

Pagination or Media Count:

41.0

Abstract:

A stacked vacuum x-ray diode has been developed for application to Advanced Concept Simulation Facilities. A three channel diode was designed, built and tested. The three channels have 50 to 70 percent energy resolution with bands centered at approximately 1, 2.25 and 6.6 keV. Alternative channel designs are readily obtainable, as well as a rate diode to provide flat energy response from 1 to 20 keV. A pair of triple diodes would be capable of providing temporal and spectral resolution of the output of low energy simulation facilities in the energy range from 1 to 10 keV.

Subject Categories:

  • Nuclear Instrumentation

Distribution Statement:

APPROVED FOR PUBLIC RELEASE