Evaluation of Procedures in Automated Residual Stress Measurements.
NORTHWESTERN UNIV EVANSTON ILL DEPT OF MATERIALS SCIENCE AND ENGINEERING
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The measurement of residual stress by the X-ray diffraction technique involves determining the lattice spacing of a crystallographic plane at different inclinations of the sample and relating the change in the spacing to a stress on the surface of the specimen. The sources of error in determining the residual stress are investigated in this report. A short review of the fundamental principles of the measurement is given. The important instrumental and geometric factors contributing to errors in the measured stress are presented. To account for random errors in the data accumulation on the measured stress, a complete statistical analysis based on a least-squares parabola is given.