Electron Temperature Dependence of Dissociative Recombination in Xenon
Scientific journal article
PITTSBURGH UNIV PA DEPT OF PHYSICS
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The three-mode microwave afterglow apparatus was used in conjunction with a high-speed grating spectrometer to study the variation with electron temperature of the recombination coefficient alphaXe2 and of the Xe excited states produced by dissociative recombination over the range 300 K or 8000 K.
- Electricity and Magnetism
- Nuclear Physics and Elementary Particle Physics