Use of the Fourier Analyzer for Far-Field Speckle Analysis.
ARMY MISSILE RESEARCH DEVELOPMENT AND ENGINEERING LAB REDSTONE ARSENAL ALA PHYSICAL SCIENCES DIRECTORATE
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A sequel to Surface Information From Far-Field Speckle Analysis AD-A031239 report No. RR-TR-76-2 is presented. A clarification of how the theoretical results of that report relate to experimental data input for the HP 5451B Fourier analyzer is undertaken. The relationship between time, frequency, and position as well as the appropriate choice of data intervals are discussed. The rectangular window width is shown to be incorporated into a function defined in the previous work which determines resolution of surface detail. Author
- Optical Detection and Detectors