Electroreflectance Study of Ion-Implanted ZnO Single Crystals.
AIR FORCE INST OF TECH WRIGHT-PATTERSON AFB OHIO SCHOOL OF ENGINEERING
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Fundamental edge electroreflectance spectra of ion-implanted zinc oxide ZnO single crystals were measured at room temperature using the electrolyte technique. Measurements were made with the electric vector of the incident light both parallel and perpendicular to the hexagonal axis of the crystals. Quantitive results were obtained for the fundamental edge transition. The effects on the electroreflectance spectra due to electrochemical reactions and different band bending conditions were examined. Since the ion-implantation process produced deep-centered impurities, the electroreflectance spectra did not exhibit impurity associated transitions. Author
- Solid State Physics