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Storage Reliability of Missile Materiel Program. Storage Reliability Analysis Summary Report. Volume 1. Electrical and Electronic Devices
Final rept. Jun 1974-Jun 1976
RAYTHEON CO HUNTSVILLE AL LIFE CYCLE ANALYSIS GROUP
Pagination or Media Count:
The report summarizes analyses on the non-operating reliability of missile electrical and electronic devices. The objective of the program is the development of non-operating storage reliability prediction and assurance techniques for missile materiel. Included are analyses of integrated circuits, semiconductors, vacuum tubes, resistors, capacitors, inductive devices, crystals, batteries, connections, connectors and printed wiring boards.
APPROVED FOR PUBLIC RELEASE