Accession Number:

ADA026275

Title:

Storage Reliability of Missile Materiel Program. Storage Reliability Analysis Summary Report. Volume 1. Electrical and Electronic Devices

Descriptive Note:

Final rept. Jun 1974-Jun 1976

Corporate Author:

RAYTHEON CO HUNTSVILLE AL LIFE CYCLE ANALYSIS GROUP

Personal Author(s):

• Malik, Dennis F.

Report Date:

1976-05-01

Pagination or Media Count:

276.0

Abstract:

The report summarizes analyses on the non-operating reliability of missile electrical and electronic devices. The objective of the program is the development of non-operating storage reliability prediction and assurance techniques for missile materiel. Included are analyses of integrated circuits, semiconductors, vacuum tubes, resistors, capacitors, inductive devices, crystals, batteries, connections, connectors and printed wiring boards.

Descriptors:

• *ELECTRONIC EQUIPMENT
• *RELIABILITY
• *ELECTRICAL EQUIPMENT
• *GUIDED MISSILE COMPONENTS
• COILS
• FAILURE
• ELECTRON TUBES
• STORAGE
• RESISTORS
• GUIDED MISSILE BATTERIES
• TRANSFORMERS
• CAPACITORS
• ELECTRIC CONNECTORS
• LIFE CYCLE TESTING
• RELIABILITY(ELECTRONICS)
• PRINTED CIRCUITS
• INTEGRATED CIRCUITS
• SEMICONDUCTOR DEVICES
• SEMICONDUCTORS

Subject Categories:

• Electrical and Electronic Equipment
• Manufacturing and Industrial Engineering and Control of Production Systems
• Guided Missile Launching and Basing Support

Distribution Statement:

APPROVED FOR PUBLIC RELEASE