Accession Number:

ADA026248

Title:

X-Ray Dose Enhancement. Volume I. Summary Report.

Descriptive Note:

Interim technical rept.,

Corporate Author:

SCIENCE APPLICATIONS INC MCLEAN VA

Personal Author(s):

• Chadsey,William L.
• Garth,John C.
• Sheppard,Robert L.
• Murphy,Rosemary

Report Date:

1976-05-01

Pagination or Media Count:

88.0

Abstract:

Dose profiles in silicon and polyethylene near gold have been calculated for x-ray energies of 10 to 2000 keV using the POEM Monte Carlo electron transport code. Results are presented in several formats plots of relative dose dose enhancement versus photon energy for various distances from the interface, mean relative dose over an interface region versus photon energy for various region thicknesses, dose profiles dose versus distance for various photon energies, and photo-Compton current profiles for various photon energies. The computational data are presented in this continuous, functional representation rather than in the standard histogram representation.

Descriptors:

• *X RAYS
• ELECTRON TRANSPORT
• MONTE CARLO METHOD
• SILICON
• DOSAGE
• TRANSITIONS
• RANGE(DISTANCE)
• RADIATION EFFECTS
• POLYETHYLENE

Subject Categories:

• Nuclear Physics and Elementary Particle Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE