Accession Number:

ADA026123

Title:

Storage Reliability of Missile Materiel Program, Monolithic Bipolar SSI/MSI Digital Integrated Circuit Analysis.

Descriptive Note:

Final rept. Jun 74-Jun 76,

Corporate Author:

RAYTHEON CO HUNTSVILLE ALA LIFE CYCLE ANALYSIS DEPT

Personal Author(s):

Report Date:

1976-05-01

Pagination or Media Count:

109.0

Abstract:

This report documents findings on the non-operating reliability of monolithic bipolar SSIMSI digital integrated circuits. Real time storage and accelerated testing results were analyzed and integrated to develop a non-operating reliability prediction model. Failure mechanisms are also discussed in detail. This information is part of a research program being conducted by the U. S. Army Missile Command, Redstone Arsenal, Alabama. The objective of this program is the development of non-operating storage reliability prediction and assurance techniques for missile materiel. Author

Subject Categories:

  • Electrical and Electronic Equipment
  • Manufacturing and Industrial Engineering and Control of Production Systems
  • Guided Missiles

Distribution Statement:

APPROVED FOR PUBLIC RELEASE