Storage Reliability of Missile Materiel Program, Monolithic Bipolar SSI/MSI Digital Integrated Circuit Analysis.
Final rept. Jun 74-Jun 76,
RAYTHEON CO HUNTSVILLE ALA LIFE CYCLE ANALYSIS DEPT
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This report documents findings on the non-operating reliability of monolithic bipolar SSIMSI digital integrated circuits. Real time storage and accelerated testing results were analyzed and integrated to develop a non-operating reliability prediction model. Failure mechanisms are also discussed in detail. This information is part of a research program being conducted by the U. S. Army Missile Command, Redstone Arsenal, Alabama. The objective of this program is the development of non-operating storage reliability prediction and assurance techniques for missile materiel. Author
- Electrical and Electronic Equipment
- Manufacturing and Industrial Engineering and Control of Production Systems
- Guided Missiles