Reliability Evaluation of MNOS Arrays.
Final technical rept. Jun 74-Sep 75,
SPERRY UNIVAC ST PAUL MINN DEFENSE SYSTEMS DIV
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The report describes the results of an investigation of MNOS device reliability. Two commercial device types were used as test vehicles in this study. Environmental and electrical stresses were used to accelerate failure and included high and low temperature operating life, high temperature storage, an 85C85 relative humidity test and gamma radiation exposure. A wear out study was also performed. Nearly all the failures which did occur were attributable to processing flaws or failures usually associated with MOS technology in general.
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