Accession Number:

ADA024918

Title:

Reliability Evaluation of C/MOS Technology in Complex Integrated Circuits.

Descriptive Note:

Final rept. 8 May 73-31 May 75,

Corporate Author:

RCA SOLID STATE TECHNOLOGY CENTER SOMERVILLE N J

Personal Author(s):

Report Date:

1976-03-01

Pagination or Media Count:

231.0

Abstract:

The objective of the study was to investigate reliability of small and medium scale CMOS integrated circuits. Four manufacturers type 4011A Quad 2-input NAND Gates and three manufacturers type 4015A dual four stage static shift registers were chosen as test vehicles. The study evaluated the effects of burn-ins and environmental stresses on the devices reliability. An evaluation was also made of the input protection networks and a possible screen for input protection network was established. 993 gate devices and 148 shift register devices were tested.

Subject Categories:

  • Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE