Reliability Evaluation of C/MOS Technology in Complex Integrated Circuits.
Final rept. 8 May 73-31 May 75,
RCA SOLID STATE TECHNOLOGY CENTER SOMERVILLE N J
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The objective of the study was to investigate reliability of small and medium scale CMOS integrated circuits. Four manufacturers type 4011A Quad 2-input NAND Gates and three manufacturers type 4015A dual four stage static shift registers were chosen as test vehicles. The study evaluated the effects of burn-ins and environmental stresses on the devices reliability. An evaluation was also made of the input protection networks and a possible screen for input protection network was established. 993 gate devices and 148 shift register devices were tested.
- Electrical and Electronic Equipment