Accession Number:

ADA024016

Title:

Initial Tests of Induced-Current Microcircuit Damage Produced by Lightning.

Descriptive Note:

Memorandum rept.,

Corporate Author:

NAVAL RESEARCH LAB WASHINGTON D C

Personal Author(s):

Report Date:

1976-04-01

Pagination or Media Count:

11.0

Abstract:

The vulnerability of electronics systems to damage and malfunction produced by lightning strikes is reviewed. Initial test data are shown in which this damage phenomenon is verified. The requirements and problems inherent in a magnetic-field measurement with which to accomplish an in situ measurement of lightning transients are discussed, the next series of measurements are described, and future directions for the research are indicated. AUthor

Subject Categories:

  • Atmospheric Physics
  • Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE