AN Optimal Algorithm for Testing Random Access Memories.
Final Technical rept. 1 Jul 74-1 Sep 75,
SYRACUSE UNIV N Y
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This report presents an optimum algorithm to detect any single stuck-at-1, stuck-at-0 fault and any combination of solid stuck-at-1, stuck-at-0 multiple faults in a random access memory using only the n-bit memory address register and m-bit memory buffer register input input and output lines. It is shown that this algorithm requires 4 x 2n memory accesses. Author
- Computer Hardware