Accession Number:
ADA023894
Title:
AN Optimal Algorithm for Testing Random Access Memories.
Descriptive Note:
Final Technical rept. 1 Jul 74-1 Sep 75,
Corporate Author:
SYRACUSE UNIV N Y
Personal Author(s):
Report Date:
1976-03-01
Pagination or Media Count:
29.0
Abstract:
This report presents an optimum algorithm to detect any single stuck-at-1, stuck-at-0 fault and any combination of solid stuck-at-1, stuck-at-0 multiple faults in a random access memory using only the n-bit memory address register and m-bit memory buffer register input input and output lines. It is shown that this algorithm requires 4 x 2n memory accesses. Author
Descriptors:
Subject Categories:
- Computer Hardware