Accession Number:

ADA023894

Title:

AN Optimal Algorithm for Testing Random Access Memories.

Descriptive Note:

Final Technical rept. 1 Jul 74-1 Sep 75,

Corporate Author:

SYRACUSE UNIV N Y

Personal Author(s):

Report Date:

1976-03-01

Pagination or Media Count:

29.0

Abstract:

This report presents an optimum algorithm to detect any single stuck-at-1, stuck-at-0 fault and any combination of solid stuck-at-1, stuck-at-0 multiple faults in a random access memory using only the n-bit memory address register and m-bit memory buffer register input input and output lines. It is shown that this algorithm requires 4 x 2n memory accesses. Author

Subject Categories:

  • Computer Hardware

Distribution Statement:

APPROVED FOR PUBLIC RELEASE