Accession Number:

ADA022862

Title:

Reliability Evaluation of Semiconductor Memories.

Descriptive Note:

Final rept.,

Corporate Author:

MACRODATA CORP WOODLAND HILLS CALIF

Personal Author(s):

Report Date:

1976-02-01

Pagination or Media Count:

278.0

Abstract:

The report presents a study which was conducted to evaluate the reliability of high usage semiconductor memories. The study determined parametric and functional tests which are required for military specifications. Special attention was given to the application of functional tests to detect and screen out devices with pattern sensitivity. Five types which cover a large part of the wide spectrum of memory devices in use today were chosen for characterization and testing to determine optimum parametric and functional tests and limits required in military specifications for memories.

Subject Categories:

  • Computer Hardware

Distribution Statement:

APPROVED FOR PUBLIC RELEASE