Reliability Evaluation of Programmable Read-Only Memories (PROMs).
Final technical rept. 4 Mar 74-3 Mar 75,
HUGHES AIRCRAFT CO CULVER CITY CALIF DATA SYSTEMS DIV
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The primary objectives of this study were to 1 assess unique factors affecting the reliability of 1024-bit open collector programmable read-only memories PROMs from three technologies, i.e., nichrome fusible links, titanium-tungsten fusible links and avalanche induced migration AIM or blown diode technology 2 recommend programming, testing and screening guidelines for the subject PROMs and 3 develop a failure prediction technique for the subject PROMs.
- Electrical and Electronic Equipment
- Computer Programming and Software
- Computer Hardware