Infrared Vidicons Employing Metal-Silicon Schottky Diode Arrays
Final rept. 27 Mar 1974-26 Sep 1975
GENERAL ELECTRIC CO PHILADELPHIA PA SPACE DIV
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Research was conducted to demonstrate the utility of silicon integrated circuit technology in addressing problems of cost and reliability in infrared imaging systems. An experiment was designed to demonstrate the feasibility of infrared imagery using a vidicon tube in which a high velocity beam is used to interrogate a mosaic of palladium-P type silicon Schottky barrier diodes.
- Electrooptical and Optoelectronic Devices