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Reliability Analysis of Microcircuit Failures in Avionic Systems (RAMFAS).
Final rept. 19 Jun 74-19 Jun 75,
MCDONNELL AIRCRAFT CO ST LOUIS MO
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The report describes the 12-month study of the Reliability Analysis of Microcircuit Failures in Avionic Systems RAMFAS program conducted on F-15 Avionic equipments during the period from June 1974 to June 1975. The objectives of this RAMFAS Program were 1 To assess the reliability of current microcircuit technology in the avionics environment 2 To assess the validity and effectiveness of presently used techniques for microcircuit procurement, screening quality assurance and reliability prediction. These objectives were to be achieved through in-depth microcircuit failure analysis and fallout data on the F-15 Head-Up Display HUD and Interference Blanker Set IBS equipments over the total procurement cycle during the study period. The report documents the analysis of 308 devices out of 438 microcircuit removals from 31,393 microcircuits assembled, tested and shipped to the field in 39 HUD and 35 IBS F-15 equipments.
APPROVED FOR PUBLIC RELEASE