Accession Number:

ADA021349

Title:

When Thickness is Measured in Atoms,

Descriptive Note:

Corporate Author:

FOREIGN TECHNOLOGY DIV WRIGHT-PATTERSON AFB OHIO

Personal Author(s):

Report Date:

1976-02-10

Pagination or Media Count:

11.0

Abstract:

Discusses thin film devices.

Subject Categories:

  • Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE