A Spectral Theoretic Approach to Fault Analysis in Linear Sequential Circuits
TEXAS TECH UNIV LUBBOCK DEPT OF ELECTRICAL ENGINEERING
Pagination or Media Count:
In this paper the problem of fault analysis in linear and affine sequential circuits is treated. These classes of systems provide for the treatment of several linear and nonlinear faults common in digital circuitry. The solution to the linear and affine sequential circuit problem is obtained via the development of a spectral theory for such systems over finite fields. A stepwise fault analysis procedure for this problem class is presented along with many examples illustrating the advantages that memory provides in digital fault analysis.
- Electrical and Electronic Equipment