Digital Microcircuit Characterization and Specification. Volume II and III.
Final technical rept. Feb 74-Mar 75,
GENERAL ELECTRIC CO PITTSFIELD MASS
Pagination or Media Count:
The volume consists of logic integrity test LIT reports for tests generated for the integrated circuit devices listed in the index. All of the tests are for devices that either are already included in MIL-M-38510 slash sheets or are to be included in future slash sheets. LITs were generated for TTL, STTL and CMOS family types. For the CMOS devices, additional tests were generated to check for worst case leakage paths. As a part of the test generations, the tests were proved by testing representative devices. In some instances LITs were submitted by integrated circuit manufacturers where upon they were checked for accuracy and completeness and then were edited, updated and proof tested.
- Electrical and Electronic Equipment
- Manufacturing and Industrial Engineering and Control of Production Systems