Accession Number:

ADA017020

Title:

Measurement of X-ray Cross Sections Relevant to a Scanning Ion Microscope.

Descriptive Note:

Final rept.,

Corporate Author:

MARYLAND UNIV COLLEGE PARK DEPT OF PHYSICS AND ASTRONOMY

Personal Author(s):

• Martin,F. W.

Report Date:

1975-10-07

Pagination or Media Count:

8.0

Abstract:

The following is discussed in this report Design and construction of a novel soft X-ray spectrometer Integration of the spectrometer into a concurrently designed and constructed vacuum system and electronic system Measurement of the 280 eV K X-ray emission cross section for carbon foil bombarded with 1-3 MeV carbon, nitrogen and oxygen ions Discovery and analysis of satellite lines and solid state effects in the 270-290 eV region of spectra measured during prosecution of the above item.

Descriptors:

• *Microscopes
• *Field emission
• *X ray diffraction
• Instrumentation
• Particle collisions

Subject Categories:

• Test Facilities, Equipment and Methods
• Crystallography

Distribution Statement:

APPROVED FOR PUBLIC RELEASE