Planar Near-Field Measurement Techniques on High Performance Arrays. Part 1. Error Analysis for Nonscanning Beam Patterns
Final rept. Jul 1973-Jul 1974
NATIONAL BUREAU OF STANDARDS BOULDER CO ELECTROMAGNETIC TECHNOLOGY DIV
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General expressions are derived for estimating the errors in the sum or difference far-field pattern of electrically large aperture antennas which are measured by the planar near-field scanning technique. Upper bounds are determined for the far-field errors produced by 1 the nonzero fields outside the finite scan area, 2 the inaccuracies in the positioning of the probe, 3 the distortion and nonlinearities of the instrumentation which measures the amplitude and phase of the probe output, and 4 the multiple reflections. Computational errors, uncertainties in the receiving characteristics of the probe, and errors involved with measuring the input power to the test antenna are briefly discussed.
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