Effects of Nuclear Radiation on Magnetic Bubble Domain Materials and Devices.
Final rept. 1 May 73-31 Dec 74,
ROCKWELL INTERNATIONAL CORP ANAHEIM CALIF ELECTRONICS RESEARCH DIV
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The effort concentrates on radiation-induced failure thresholds and associated mechanisms for magnetic bubble domain devices. However, experiments to investigate the effects of low-energy X rays on bubble domain materials are also described. In the low-energy X-ray studies, changes in hard bubble suppression properties, or ferromagnetic-resonance spectra, were looked for in either of two types of iron garnets exposed to more than 6,000,000 R. The primary effort concerned transient radiation-induced memory loss. A 30 ns pulse of approximately 1.5 MeV electrons was used. Failure probabilities as a function of dose per pulse were obtained for several devices. Transient radiation-induced burnout of domain sensors was also studied for both thin 300 A and thick 4000 A permalloy detectors.
- Computer Hardware
- Radioactivity, Radioactive Wastes and Fission Products
- Electricity and Magnetism