Accession Number:

ADA010889

Title:

Capacitance Studies on Synthetic Phospholipid Langmuir Films.

Descriptive Note:

Interim rept.,

Corporate Author:

NORTHWESTERN UNIV EVANSTON ILL DEPT OF MATERIALS SCIENCE AND ENGINEERING

Personal Author(s):

Report Date:

1975-05-01

Pagination or Media Count:

29.0

Abstract:

Synthetic phosphatidylcholine Langmuir films have been incorporated into metal-insulator-metal MIM thin film junctions. The capacitance characteristics of these junctions have been studied as a function of temperature, the number of lipid layers in the insulating layer, and the length of the hydrocarbon chains of the lipid molecule. The thickness of the oxide layer on the base aluminum electrode has been determined to be approximately 40A, and its effects on the capacitance characteristics has been considered in some detail. Indications of phase transitions in the temperature dependence of the capacitance imply that the basic lamellar arrangement of the lipid molecules is retained even after the samples are subjected to a dehydrating vacuum annealing process. An examination of the effects of varying the hydrocarbon chain length and salt content of the subphase during sample fabrication showed that capacitance characteristics of the MIM junction are very sensitive to small structural changes in the insulating layer.

Subject Categories:

  • Biochemistry
  • Atomic and Molecular Physics and Spectroscopy
  • Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE