Production Engineering Measure for Low Noise Solid-State Oscillator.
Quarterly rept. no. 4, 19 Feb 73-19 May 73,
MICROWAVE ASSOCIATES INC BURLINGTON MASS
Pagination or Media Count:
A new mesa etching technique is described which produces better defined mesas. This process increases the yield of useful chips from each wafer. A definite correlation between diode efficiency, AM noise levels, and diode capacitance is described. The present oscillator design is described and the existing deficiencies of this design are outlined. Corrections which can be made to this design to provide an acceptable oscillator are described.
- Electrical and Electronic Equipment
- Manufacturing and Industrial Engineering and Control of Production Systems