Structure of Semiconductor Compounds in the Pseudobinary Systems of PbTe-Bi2Te3, SnTe-Bi2Te3, GeTe-Bi2Te3, SnTe-Sb2Te3,
ARMY FOREIGN SCIENCE AND TECHNOLOGY CENTER CHARLOTTESVILLE VA
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Diffraction class and extinction patterns, as well as unit cell parameters were measured from epigrams on the slip plane and X-ray diffraction photos. Integral intensities of the reflections were determined by diffractometer and processed by digital computer. Unit cell parameters and structure and calculated interatomic distances are presented. GeBi4Te7 parameters differ, mainly in the c parameter, owing to introduction of NaCl structures into the substance.
- Solid State Physics