Accession Number:

ADA007788

Title:

Reliability Study of Microwave Power Transistors.

Descriptive Note:

Final rept. Mar 72-Nov 74,

Corporate Author:

TRW INC LAWNDALE CALIF SEMICONDUCTOR DIV

Personal Author(s):

Report Date:

1975-01-01

Pagination or Media Count:

207.0

Abstract:

As the fineness of structure in microelectronics is stressed by the need for power in microwave transistors, the minimal amounts of material used in their construction are pushed to their limits. This work seeks to understand those limits for gold metallization and bonding, to verify the modelling experimentally, and to fit the data taken to a working guideline. It also seeks to relate accelerated data taken under normal conditions for more accurate reliability prediction.

Subject Categories:

  • Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE