Accession Number:

ADA007277

Title:

Electron Beam Semiconductor Device with Mesa Diode, Reliability and Failure Determination.

Descriptive Note:

Final rept. Jan 73-Dec 74,

Corporate Author:

MACHLETT LABS INC STAMFORD CONN

Personal Author(s):

Report Date:

1975-02-01

Pagination or Media Count:

28.0

Abstract:

Ten water cooled EBS devices were fabricated, processed and delivered to ECOM for life and reliability tests. Of 4 tubes tested thus far one was operated for 1200 hours at a maximum dissipation of 7 watts. Others had relatively shorter life times. In depth analysis of failure was carried out on 2 tubes.

Subject Categories:

  • Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE