Electron Beam Semiconductor Device with Mesa Diode, Reliability and Failure Determination.
Final rept. Jan 73-Dec 74,
MACHLETT LABS INC STAMFORD CONN
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Ten water cooled EBS devices were fabricated, processed and delivered to ECOM for life and reliability tests. Of 4 tubes tested thus far one was operated for 1200 hours at a maximum dissipation of 7 watts. Others had relatively shorter life times. In depth analysis of failure was carried out on 2 tubes.
- Electrical and Electronic Equipment