Accession Number:
ADA007277
Title:
Electron Beam Semiconductor Device with Mesa Diode, Reliability and Failure Determination.
Descriptive Note:
Final rept. Jan 73-Dec 74,
Corporate Author:
MACHLETT LABS INC STAMFORD CONN
Personal Author(s):
Report Date:
1975-02-01
Pagination or Media Count:
28.0
Abstract:
Ten water cooled EBS devices were fabricated, processed and delivered to ECOM for life and reliability tests. Of 4 tubes tested thus far one was operated for 1200 hours at a maximum dissipation of 7 watts. Others had relatively shorter life times. In depth analysis of failure was carried out on 2 tubes.
Descriptors:
Subject Categories:
- Electrical and Electronic Equipment