Accession Number:
ADA007002
Title:
Screening of Integrated Circuits,
Descriptive Note:
Corporate Author:
IIT RESEARCH INST CHICAGO ILL RELIABILITY ANALYSIS CENTER
Personal Author(s):
Report Date:
1969-05-01
Pagination or Media Count:
53.0
Abstract:
The monograph describes the basic philosophy of screening monolithic integrated circuits, IC failure modes and mechanisms, available screening techniques, and the establishment of a total screening program. The Appendix presents a summary of recent screening experience in terms of costs, screen test results and reliability improvement.
Subject Categories:
- Electrical and Electronic Equipment
- Manufacturing and Industrial Engineering and Control of Production Systems