Accession Number:

ADA007002

Title:

Screening of Integrated Circuits,

Descriptive Note:

Corporate Author:

IIT RESEARCH INST CHICAGO ILL RELIABILITY ANALYSIS CENTER

Personal Author(s):

• Myers,T. R.

Report Date:

1969-05-01

Pagination or Media Count:

53.0

Abstract:

The monograph describes the basic philosophy of screening monolithic integrated circuits, IC failure modes and mechanisms, available screening techniques, and the establishment of a total screening program. The Appendix presents a summary of recent screening experience in terms of costs, screen test results and reliability improvement.

Descriptors:

• *INTEGRATED CIRCUITS
• TEST METHODS
• INSPECTION
• SELECTION
• RELIABILITY(ELECTRONICS)

Subject Categories:

• Electrical and Electronic Equipment
• Manufacturing and Industrial Engineering and Control of Production Systems

Distribution Statement:

APPROVED FOR PUBLIC RELEASE