Microcircuit Generic Environmental Data.
IIT RESEARCH INST CHICAGO ILL
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The compendium contains environmental test and screenburn-in results on microcircuit devices. Data are organized according to applied test stress and device generic properties. Aside from a description of the device and stress conditions, each entry reports the number of devices tested, number failed and observed failure modes. A total of 1563 data entries are contained in this monolithic environmental data and screenburn-in results. This compendium is revised and reissued annually.
- Electrical and Electronic Equipment