Accession Number:
ADA003326
Title:
Elemental and Chemical Characterization of Solid Surfaces with Soft X-Ray Appearance Potential Spectroscopy.
Descriptive Note:
Final rept.,
Corporate Author:
AIR FORCE MATERIALS LAB WRIGHT-PATTERSON AFB OHIO
Personal Author(s):
Report Date:
1974-09-01
Pagination or Media Count:
54.0
Abstract:
A study on the suitability of using a soft x-ray appearance potential spectrometer as a measurement tool for characterizing elemental and chemical species on solid surfaces has been completed. Two principal objectives of the research have been 1 to assess such characterization capabilities for analysis of materials that are of interest to ongoing research and development programs of the Air Force Materials Laboratory and 2 to demonstrate experimental techniques which improve the instrumentation. The authors present and interpret experimental measurements that show 1 this technique is sensitive to the molecular state of titanium atoms in several compounds, 2 the sensitivity of SXAPS to different elements depends strongly upon the atomic number, 3 one major reason which explains much of this Z-dependence is the excitation of threshold resonant x-rays at some core levels in many elements, and 4 there is available experimental apparatus which can be used to significantly improve the signal-to-noise ratio in the observed spectra.
Descriptors:
Subject Categories:
- Atomic and Molecular Physics and Spectroscopy