Elemental and Chemical Characterization of Solid Surfaces with Soft X-Ray Appearance Potential Spectroscopy.
AIR FORCE MATERIALS LAB WRIGHT-PATTERSON AFB OHIO
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A study on the suitability of using a soft x-ray appearance potential spectrometer as a measurement tool for characterizing elemental and chemical species on solid surfaces has been completed. Two principal objectives of the research have been 1 to assess such characterization capabilities for analysis of materials that are of interest to ongoing research and development programs of the Air Force Materials Laboratory and 2 to demonstrate experimental techniques which improve the instrumentation. The authors present and interpret experimental measurements that show 1 this technique is sensitive to the molecular state of titanium atoms in several compounds, 2 the sensitivity of SXAPS to different elements depends strongly upon the atomic number, 3 one major reason which explains much of this Z-dependence is the excitation of threshold resonant x-rays at some core levels in many elements, and 4 there is available experimental apparatus which can be used to significantly improve the signal-to-noise ratio in the observed spectra.
- Atomic and Molecular Physics and Spectroscopy