Accession Number:

ADA000081

Title:

Microcircuit Device Failure Rates.

Descriptive Note:

Corporate Author:

IIT RESEARCH INST CHICAGO ILL RELIABILITY ANALYSIS CENTER

Personal Author(s):

Report Date:

1974-06-01

Pagination or Media Count:

312.0

Abstract:

The report is a compendium of microcircuit device failure rates organized by device type and manufacturer. This listing of 3138 entries is compiled from data generated during government, industrial test programs and system operations. Each entry contains a description of the device configuration, applied stress conditions and the failure rate statistics, including modes of observed failures. Failure rates are computed at the upper 60 confidence level assuming an exponential failure distribution. The compendium is completely updated and reissued annually. Author

Subject Categories:

  • Electrical and Electronic Equipment
  • Manufacturing and Industrial Engineering and Control of Production Systems

Distribution Statement:

APPROVED FOR PUBLIC RELEASE