Accession Number:
AD1158329
Title:
Analysis of Target Location Error
Descriptive Note:
[Technical Report, Briefing Charts]
Corporate Author:
812 TSS/ENT
Personal Author(s):
Report Date:
2022-02-02
Pagination or Media Count:
22
Abstract:
This presentation details the application of stochastic differential equation SDE models to the characterization of target location error TLE. Use of a SDE is motivated by using an ordinary differential equation to model expected TLE as a function of range to the target and a Weiner process added to model TLE uncertainty as a function of range to the target. Inclusion of a Wiener process necessitated the use of an Ito integral basics of Ito calculus in this application are reviewed. Both the Ornstein-Uhlenbeck OU and Cox-Ingersoll-Ross CIR models were considered. Eight test runs from a target location system were used to fit the models the CIR model was used to characterize system performance. Results of this fit are presented.