Accession Number:

AD1098417

Title:

Surface Phonon Polariton Resonance Imaging Using Long-Wave Infrared-Visible Sum-Frequency Generation Microscopy

Descriptive Note:

Journal Article - Open Access

Corporate Author:

NAVAL RESEARCH LAB WASHINGTON DC WASHINGTON United States

Report Date:

2019-10-17

Pagination or Media Count:

7.0

Abstract:

We experimentally demonstrate long-wave infrared-visible sum-frequency generation microscopy for imaging polaritonic resonances of infrared IR nanophotonic structures. This nonlinear-optical approach provides direct access to the resonant enhancement of the polaritonic near fields, while the spatial resolution is limited by the wavelength of the visible sum-frequency signal. As a proof-of-concept, we here study periodic arrays of subdiffractional nanostructures made of 4H-silicon carbide supporting localized surface phonon polaritons. By spatially scanning tightly focused incident beams, we observe excellent sensitivity of the sum-frequency signal to the resonant polaritonic field enhancement, with a much improved spatial resolution, here determined by the focus size of the visible up-conversion radiationbeam. However, we report that the tight focusing can also induce sample damage, ultimately limiting the achievable resolution with the scanning probe method. As a perspective approach toward overcoming this limitation, we discuss the concept of using wide-field sum-frequency generation microscopy as a universal experimental tool that would offer long-wave IR super-resolution microscopy with spatial resolution far below the IR diffraction limit.

Subject Categories:

  • Solid State Physics
  • Optics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE