Accession Number:

AD1098215

Title:

Trap Characterization in Ultra-Wide Bandgap Al0.65ga0.4n/Al0.4Ga0.6N MOSHFET's with ZrO2 Gate Dielectric Using Optical Response and Cathodoluminescence [Appl. Phys. Lett. 115, 213502 (2019)]

Descriptive Note:

Journal Article - Open Access

Corporate Author:

NAVAL RESEARCH LAB WASHINGTON DC WASHINGTON United States

Report Date:

2019-12-09

Pagination or Media Count:

2.0

Abstract:

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE