Sample Preparation Methods for Diamond-Silicon-Carbide Microstructure Analysis
Technical Report,01 Jul 2019,17 Sep 2019
CCDC Army Research Laboratory Aberdeen Proving Ground United States
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Microstructural characterization of diamond-containing ceramic composites, like diamond silicon carbide SiC, requires advanced sample preparation methods. Tradition mechanical polishing methods cannot be used due to the addition of diamond particles. Instead, techniques like the scaife process for diamond knife polishing, ion polishing, or laser polishing must be used. In this report a diamond SiC composite, polished using these three methods is characterized using scanning electron microscopy SEM, Raman spectroscopy, and electron backscatter diffraction EBSD. This report shows which polishing methods are sufficient to acquire data for each characterization technique. While the scaife process is the best method for polishing diamond SiC, all characterization techniques are feasible over a large area. Ion polishing is also capable of polishing this material well enough for each characterization technique, but only over small areas. Laser polishing is sufficient enough for SEM and Raman but too textured for accurate EBSD.
- Geology, Geochemistry and Mineralogy
- Laminates and Composite Materials
- Inorganic Chemistry