Accession Number:

AD1083754

Title:

High-Resolution X-Ray Diffractometer for Advanced Epitaxial Thin-Film and Nanoscale Materials Characterization

Descriptive Note:

Technical Report,05 Sep 2017,04 Jan 2019

Corporate Author:

University of New Mexico Albuquerque Albuquerque United States

Report Date:

2019-04-05

Pagination or Media Count:

17.0

Abstract:

The major goal of this project was for the Center for High Technology Materials CHTM at the University of New Mexico UNM to specify, order, acquire, install, and qualify a new state-of-the-art high-resolution X-ray diffractometer to support Department of Defense DoD research related to advanced epitaxial thin-film and nanoscale materials growth and characterization.

Subject Categories:

  • Test Facilities, Equipment and Methods
  • Miscellaneous Materials
  • Test Facilities, Equipment and Methods
  • Miscellaneous Materials

Distribution Statement:

APPROVED FOR PUBLIC RELEASE