High Speed Optoelectronic Device Characterization System
Technical Report,05 Sep 2017,04 Sep 2018
University of Texas at Arlington Arlington United States
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With this equipment funding support, we acquired a Keysight N4357D 26.5 GHz single-mode lightwave component analyzer LCA and ssociated sourcevoltage test units for high-speed membrane laser research, as well as other extreme photonic devices and integrated chip testing. The N4375D LCA is based on the new 4-port N5222A PNA Series microwave network analyzer with high RF output power. This enables both small signal analysis and large signal analysis on device under test. 1310 nm and 1550 nm laser sources were included in the system for modulators and detector measurement at these wavelengths. The system is capable of high speed laser characterization.
- Electrical and Electronic Equipment