Accession Number:

AD1065545

Title:

Understanding Mechanisms of Radiation Degradation in Electronic and Optoelectronic Devices: A Multi-timescale Model

Descriptive Note:

Technical Report,17 Oct 2016,17 Oct 2018

Corporate Author:

University of Michigan Ann Arbor United States

Personal Author(s):

Report Date:

2018-10-16

Pagination or Media Count:

38.0

Abstract:

The purpose of this funding is to support the development of a theory to describe effects of radiation-induced defects in electronic and optoelectronic devices. No actual experiments will be performed on this effort. This project will continue a research effort at the University of Michigan to simulate atomistic, and meso-scale behavior of defect evolutions in compound semiconductors, including ultrafast displacement cascade, intermediate defect stabilization and cluster formation,as well as slow defect reaction and migration. Based on atomic-level simulations, non-ionization energy loss has been determined.

Subject Categories:

  • Electrical and Electronic Equipment
  • Electrooptical and Optoelectronic Devices

Distribution Statement:

APPROVED FOR PUBLIC RELEASE