Small-angle X-ray Scattering for Nanostructured Polymers Research and Education
Technical Report,15 Aug 2015,14 Aug 2016
Texas Engineering Experiment Station College Station United States
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The acquisition of a small-angle X-ray scattering SAXS system for characterizing nanostructured polymers for research and education at Texas A and M University is requested. The targeted model is the S-MAX 3000 High Brilliance 3 Pinhole SAXS System Rigaku with a high intensity MicroMax MM-003 micro-focus X-ray generation system sealed micro-focus X-ray tube. The S-MAX 3000 pinhole SAXS camera design includes a high brilliance X-ray source and a 3-meter, fully evacuated camera length, which provides both high intensity and high resolution. Coupled with a fully integrated two-dimensional multi-wire proportional counter, the system is capable of making highly sensitive measurements for both isotropic and anisotropic materials. The Rigaku S-MAX 300 possesses high brilliance, is user friendly, and requires significantly low maintenance costs to maintain high levels of operation over a long lifetime. The SAXS system measures phase segregated structural features of polymers in the dimensions of nanometers, which is critical in understanding structure-property relationships in functional polymers. The PI is actively involved in highly collaborative DoD-funded research in polymeric materials with ARL scientists. The requested SAXS system will have a significant impact on advancing this research with a detailed understanding of morphology and properties at the nanometer scale. The proposed instrument will also have a strong educational impact, which will build on existing strengths of Texas A and M in graduate, post-graduate, and undergraduate research, as well as interaction with students and teachers at the K-12 level.
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