A New Fit to Secondary Emission Yield in the Low Impact Voltage Regime: An Improvement of Vaughan's Expression (Postprint)
Journal Article - Open Access
University of Cincinnati Cincinnati United States
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Reducing the emission of secondary electrons from materials is critical to improved efficiency and increased performance in high power vacuum electronics. A new mathematical expression for the secondary emission yield SEY as a function of the impact voltage up to a maximum of 5 kilovolts is proposed which is an extension of a formula first suggested by Vaughan. The new analytical fit and Vaughans fit are compared with SEY experimental data reported by others and measured by our group. The new analytical expression gives good fits to SEY experimental data in all cases, even when the SEY maximum is either slightly larger or below unity, two situations for which Vaughans fit is either inadequate or inapplicable.
- Nuclear Physics and Elementary Particle Physics