Accession Number:



Polarized Optical Microscope and Scanning Tunneling Microscope for a Hierarchical Material Characterization System

Descriptive Note:

[Technical Report, Final Report]

Corporate Author:

University of Miami - Coral Gables

Personal Author(s):

Report Date:


Pagination or Media Count:



The aim was to acquire a variable temperature polarized optical microscope POM and a scanning tunneling microscope STM, which together constituted a system for the purpose of characterizing hierarchical nanostructures at different length scales. The Hierarchical Material Characterization System, thereafter called System, which include two analytical instruments, namely a McCrone Variable Temperature Polarized Optical Microscope 46,316 and a Nanosurf NairoSTM Scanning Tunneling Microscope 11,731.

Subject Categories:

  • Miscellaneous Materials
  • Optics

Distribution Statement:

[A, Approved For Public Release]