Polarized Optical Microscope and Scanning Tunneling Microscope for a Hierarchical Material Characterization System
Technical Report,15 Aug 2015,14 Aug 2016
University of Miami - Coral Gables Coral Gables United States
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The aim was to acquire a variable temperature polarized optical microscope POM and a scanning tunneling microscope STM, which together constituted a system for the purpose of characterizing hierarchical nanostructures at different length scales. The Hierarchical Material Characterization System, thereafter called System, which include two analytical instruments, namely a McCrone Variable Temperature Polarized Optical Microscope 46,316 and a Nanosurf NairoSTM Scanning Tunneling Microscope 11,731.
- Miscellaneous Materials