Accession Number:
AD1058712
Title:
Polarized Optical Microscope and Scanning Tunneling Microscope for a Hierarchical Material Characterization System
Descriptive Note:
Technical Report,15 Aug 2015,14 Aug 2016
Corporate Author:
University of Miami - Coral Gables Coral Gables United States
Personal Author(s):
Report Date:
2017-03-07
Pagination or Media Count:
9.0
Abstract:
The aim was to acquire a variable temperature polarized optical microscope POM and a scanning tunneling microscope STM, which together constituted a system for the purpose of characterizing hierarchical nanostructures at different length scales. The Hierarchical Material Characterization System, thereafter called System, which include two analytical instruments, namely a McCrone Variable Temperature Polarized Optical Microscope 46,316 and a Nanosurf NairoSTM Scanning Tunneling Microscope 11,731.
Descriptors:
Subject Categories:
- Miscellaneous Materials
- Optics