Accession Number:

AD1058704

Title:

K-Space Imaging and Excitation Using Fourier Microscopy

Descriptive Note:

[Technical Report, Final Report]

Corporate Author:

CUNY - City College of New York

Personal Author(s):

• Menon, Vinod

Report Date:

2017-02-27

Pagination or Media Count:

12

Abstract:

This instrumentation grant helped develop a Fourier space k-space imaging and spectroscopy facility in the PIs laboratory at CCNY. The k-space imaging system consists of an Olympus inverted microscope with the back Fourier plane of the objective focused into the slit of a Princeton Instruments monochromator and detected by an EMCCD camera. The input to the inverted microscope is either a laser for photoluminescence or a white light source for reflection and absorption measurements.

Descriptors:

• materials science
• optical properties
• optics
• band structures
• light sources
• metamaterials
• energy transfer
• materials laboratories
• new york
• photonic crystals
• engineering
• instrumentation
• materials
• optical fibers
• phase transformations
• semiconductors
• surface plasmon polaritons
• united states
• white light
• energy bands

Subject Categories:

• Electrical and Electronic Equipment
• Optics
• Atomic and Molecular Physics and Spectroscopy

Distribution Statement:

[A, Approved For Public Release]