Electromagnetic Characterization of Materials Using a Dual Chambered High Temperature Waveguide
Technical Report,01 Sep 2014,24 Mar 2016
AIR FORCE INSTITUTE OF TECHNOLOGY WRIGHT-PATTERSON AFB OH WRIGHT-PATTERSON AFB United States
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Current high-temperature electromagnetic material characterization is a time consuming process that typically requires three days to collect data from one material specimen. The standard high-temperature process involving rectangular waveguides requires measurements of the sample, the empty waveguide, and a metal short standard completed in separate heated runs over three days. The technique developed here will reduce the measurement process from three days down to just one day. The research uses a position independent approach for isotropic materials for effective transmission and reflection parameters eliminating the need for a metal short and one measurement day. A new dual chambered waveguide design will reduce measurement time down to just one day through simultaneous measurement of the sample and the empty second chamber. A vector network analyzer VNA will be used to run X-band data collects at incrementally increasing temperatures up to approximately 1000F. Results will be the test materials permittivity and permeability as calculated from the Nicolson-Ross-Weir inversion algorithm for computing permittivity and permeability using VNA measured S-parameters at increasing temperatures.
- Electricity and Magnetism
- Electrical and Electronic Equipment
- Numerical Mathematics