All-Optical Optoacoustic Microscopy Based on Probe Beam Deflection Technique
Journal Article - Open Access
711 HPW RHDO JBSA Fort Sam Houston United States
Pagination or Media Count:
It is difficult to achieve sub-micron resolution in backward-mode OA microscopy using conventional piezoelectric detectors because of wavefront distortions caused by components placed in the optical path, between the sample and the objective lens, that are required to separate the acoustic wave from the optical beam.
- Acoustooptic and Optoacoustic Devices