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DURIP: An Ultrafast Testbed for Comprehensive Characterization of Photonics, Electronic, and Optoelectronic Properties of Inegrated Nanophotonic Structures

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Technical Report,15 Jul 2016,14 Jul 2017

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Georgia Tech Research Corporation Atlanta United States

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In this DURIP program an ultrafast characterization test bed for the characterization of high speed integrated photonic devices such as high-speed integrated photonic modulators and detectors was developed. A major requirement in performing successful research in this field is the availability of ultra-fast optoelectronic characterization tools that facilitate the study of ultrafast low-power devices and systems e.g., modulators, switches, detectors. This characterization setup has been an enabling platform for development of ultrafast, compact, and low-power high speed optoelectronic devices under several DoD grants, including ARO-funded program for the development of ultrafast graphene-based modulators and several other programs supported by ONR, DARPA, and AFOSR. The developed characterization test bed has provided Adibis groupat Georgia-Tech with an integrated ultrafast characterization tools, which has greatly enhanced its capability in fast and accurate characterization of high-speed integrated optoelectronic for the study of the device physics and high-speed device optimizations. The tool is also available to other research group at Georgia-Tech and outside researches as a shared facility.

Subject Categories:

  • Electrooptical and Optoelectronic Devices

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